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Imaging & Problem Solving Masterclass - 3M Buckley Innovation Centre - 15 February 2018 - 5pm - 7pm

The new ZEISS Imaging Suite shortly to open here at the 3M BIC offers businesses an opportunity to investigate, characterise and accurately measure prototypes and products and to look at items that have been damaged in use using laser to understand how and design preventative measures.  The ZEISS Imaging Suite will house a range of optical, laser and electron microscopes.  These techniques, also enhanced by access to X-Ray technology for internal examination, offer a forensic insight into the surface characteristics of items thus providing valuable information on manufacturing techniques, wear and tear patterns in use or in the case of failure and as part of quality assurance procedures.  Microscopic examination is applicable to materials, manufactured products and biological systems.  The event will provide an overview of each available technique and its application through real-world examples.

5.00pm - 5.30pm    Networking and Refreshments

5.30pm - 5.40pm    Dr Michael Wilson - 3M Director of Technology - A Brief Introduction

5.40pm - 6.00pm    Paul Ashton - Specialist ZEISS Microscopy - An overview of imaging based on the capabilities available at the 3M BIC and how this could benefit your business

6.00pm - 6.20pm    Dr Jane Harmer - Senior Research Fellow, School of Applied Sciences, University of Huddersfield - Biological applications of confocal in the context of business relevance

6.20pm - 6.40pm   James Halstead - Delivery Manager, NPL - ZEISS Smartproof Integrated Confocal Microscope case study

6.40pm                  Q&A and Close

There will be free parking available on site.

If you wish to attend please register here:-